OmniScan™ X3 64 Phased Array and TFM Flaw Detector with Advanced Capabilities

The OmniScan X3 flaw detector is a complete phased array toolbox. Powerful tools, including total focusing method (TFM) imaging and advanced visualization capabilities, backed by its high image quality enable you to complete your inspection with greater confidence.

Confirm Your TFM Beam Coverage in Advance

The Acoustic Influence Map (AIM) tool provides you with an instant visual model of the sensitivity based on your TFM mode, probe, settings, and simulated reflector.

The AIM tool takes the guesswork out of creating your scan plan—visualize the effect of a wave set (TFM mode), see where sensitivity stops, and adjust your scan plan accordingly.